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Use of secondary-electron yields determined from breakdown data in cathode-fall models for Ar

TitleUse of secondary-electron yields determined from breakdown data in cathode-fall models for Ar
Publication TypeJournal Article
Year of Publication1999
AuthorsPhelps, AV, Pitchford, LC, P├ędoussat, C, Donk├│, Z
JournalPlasma Sources Science and Technology
Volume8
Issue4
PaginationB1 - B2
Date PublishedJan-11-1999
ISSN0963-0252
DOI10.1088/0963-0252/8/4/401
Short TitlePlasma Sources Sci. Technol.