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Simple In-Line EUV Pulse Characterization

TitleSimple In-Line EUV Pulse Characterization
Publication TypeConference Paper
Year of Publication2002
AuthorsGibson, EA, Weinacht, TC, Backus, S, Murnane, MM, Kapteyn, HC
Conference NameAIP Conference Proceedings 641: X-RAY LASERS 2002: 8th International Conference on X-Ray Lasers, pp. 587-590
PublisherAIP
Conference LocationAspen, Colorado (USA)
URLhttp://link.aip.org/link/?APC/641/587/1&Agg=doi
DOI10.1063/1.1521081