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Imaging of semiconductor surface impurities by femtosecond near-field photoconductivity

TitleImaging of semiconductor surface impurities by femtosecond near-field photoconductivity
Publication TypeConference Paper
Year of Publication1998
AuthorsSchade, W, Osborn, DL, Preusser, J, Leone, SR
Conference NameQuantum Electronics Conference, 1998. IQEC 98. Technical Digest
PublisherOpt. Soc. America
Conference LocationSan Francisco, CA, USA
DOI10.1109/IQEC.1998.680485