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Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy

TitleDetermination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy
Publication TypeJournal Article
Year of Publication2007
AuthorsKuznetsova, I, Meier, T, Cundiff, ST, Thomas, P
JournalPhysical Review B
Volume76
Date Published10/2007
ISSN1098-0121
DOI10.1103/PhysRevB.76.153301