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Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy

TitleAnalysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
Publication TypeJournal Article
Year of Publication2010
AuthorsCossel, KC, Adler, F, Bertness, KA, Thorpe, MJ, Feng, J, Raynor, MW, Ye, J
JournalApplied Physics B
Volume100
Issue4
Pagination917 - 924
Date Published2010-09
ISSN0946-2171
DOI10.1007/s00340-010-4132-5
Short TitleAppl. Phys. B

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