TY - JOUR
AU - Konrad Lehnert
AU - K. Bladh
AU - L. Spietz
AU - D. Gunnarsson
AU - D. Schuster
AU - P. Delsing
AU - R. Schoelkopf
BT - Physical Review Letters
DA - 2003-01
DO - 10.1103/PhysRevLett.90.027002
PY - 2003
T2 - Physical Review Letters
TI - Measurement of the Excited-State Lifetime of a Microelectronic Circuit
UR - http://link.aps.org/doi/10.1103/PhysRevLett.90.027002
VL - 90
SN - 0031-9007
ER -